JSA - JIS R 1660-1
Measurement method for dielectric properties of fine ceramics in millimeter wave frequency range - Part 1: Cutoff waveguide method
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| Organization: | JSA |
| Publication Date: | 20 March 2004 |
| Status: | active |
| ICS Code (Advanced ceramics): | 81.060.30 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
JIS R 1660-1
March 20, 2004
Measurement method for dielectric properties of fine ceramics in millimeter wave frequency range - Part 1: Cutoff waveguide method
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