SN - NS-EN 15991:2011
Testing of ceramic and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV)
inactive, Most Current
| Organization: | SN |
| Publication Date: | 1 April 2011 |
| Status: | inactive |
| ICS Code (Raw materials): | 81.060.10 |
Document History
NS-EN 15991:2011
April 1, 2011
Testing of ceramic and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV)
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