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ASTM International - ASTM F24-04

Standard Method for Measuring and Counting Particulate Contamination on Surfaces

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Organization: ASTM International
Publication Date: 1 September 2004
Status: inactive
Page Count: 4
ICS Code (Properties of surfaces): 17.040.20
scope:

1.1 This method covers the size distribution analysis of particulate contamination, 5 m or greater in size, either on, or washed from, the surface of small electron-device components. A maximum variation of two to one (33 % of the average of two runs) should be expected for replicate counts on the same sample.

Note 1--For satisfactory results on clean parts, it is recommended that all procedures involved in sample preparation be conducted under a dust shield.

abstract:

This test method establishes the standard procedures for measuring and quantizing the size distribution of particulate contamination either on, or washed from, the surface of small electron-device... View More

Document History

April 1, 2020
Standard Test Method for Measuring and Counting Particulate Contamination on Surfaces
1.1 This test method covers the size distribution analysis of particulate contamination, 5 μm or greater in size, either on, or washed from, the surface of small electron-device components. A maximum...
October 1, 2015
Standard Test Method for Measuring and Counting Particulate Contamination on Surfaces
1.1 This test method covers the size distribution analysis of particulate contamination, 5 μm or greater in size, either on, or washed from, the surface of small electron-device components. A maximum...
April 1, 2009
Standard Method for Measuring and Counting Particulate Contamination on Surfaces
1.1 This test method covers the size distribution analysis of particulate contamination, 5 μm or greater in size, either on, or washed from, the surface of small electron-device components. A maximum...
ASTM F24-04
September 1, 2004
Standard Method for Measuring and Counting Particulate Contamination on Surfaces
This test method establishes the standard procedures for measuring and quantizing the size distribution of particulate contamination either on, or washed from, the surface of small electron-device...
May 10, 2000
Standard Method for Measuring and Counting Particulate Contamination on Surfaces
1.1 This method covers the size distribution analysis of particulate contamination, 5 m or greater in size, either on, or washed from, the surface of small electron-device components. A maximum...
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