DIN 50431
Testing of semiconductor materials; measurement of the resistivity of silicon or germanium single crystals by means of the four probe/direct current method with collinear array
inactive, Most Current
| Organization: | DIN |
| Publication Date: | 1 May 1988 |
| Status: | inactive |
| Page Count: | 5 |
| ICS Code (Semiconducting materials): | 29.045 |
Document History
DIN 50431
May 1, 1988
Testing of semiconductor materials; measurement of the resistivity of silicon or germanium single crystals by means of the four probe/direct current method with collinear array
A description is not available for this item.
References
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