DIN 50448
Testing of materials for semiconductor technology - Contactless determination of the electrical resistivity of semi-insulation semiconductor slices using a capacitive probe
inactive, Most Current
| Organization: | DIN |
| Publication Date: | 1 January 1998 |
| Status: | inactive |
| Page Count: | 4 |
| ICS Code (Semiconducting materials): | 29.045 |
Document History
DIN 50448
January 1, 1998
Testing of materials for semiconductor technology - Contactless determination of the electrical resistivity of semi-insulation semiconductor slices using a capacitive probe
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