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ASTM International - ASTM F1263-11(2019)

Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts

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Organization: ASTM International
Publication Date: 1 December 2019
Status: active
Page Count: 3
ICS Code (Electronic components in general): 31.020
significance And Use:

5.1 Overtesting should be done when (a) testing by variables is impractical because of time and cost considerations or because the probability distribution of stress to failure cannot be... View More

scope:

1.1 This guide covers the use of overtesting in order to reduce the required number of parts that must be tested to meet a given quality acceptance standard. Overtesting is testing a sample number of parts at a stress level higher than their specification stress in order to reduce the amount of necessary data taking. This guide discusses when and how overtesting may be applied to forming probabilistic estimates for the survival of electronic piece parts subjected to radiation stress. Some knowledge of the probability distribution governing the stress-to-failure of the parts is necessary, although exact knowledge may be replaced by over-conservative estimates of this distribution.

1.2 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

Document History

ASTM F1263-11(2019)
December 1, 2019
Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts
1.1 This guide covers the use of overtesting in order to reduce the required number of parts that must be tested to meet a given quality acceptance standard. Overtesting is testing a sample number of...
June 1, 2011
Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts
1.1 This guide covers the use of overtesting in order to reduce the required number of parts that must be tested to meet a given quality acceptance standard. Overtesting is testing a sample number of...
December 10, 1999
Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts
1.1 This guide covers the use of overtesting in order to reduce the required number of parts that must be tested to meet a given quality acceptance standard. Overtesting is testing a sample number of...
December 10, 1999
Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts
1.1 This guide covers the use of overtesting in order to reduce the required number of parts that must be tested to meet a given quality acceptance standard. Overtesting is testing a sample number of...
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