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BSI - BS EN 60749-23

Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life

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Organization: BSI
Publication Date: 24 June 2004
Status: active
Page Count: 12
ICS Code (Semiconductor devices in general): 31.080.01

Document History

BS EN 60749-23
June 24, 2004
Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
A description is not available for this item.
June 24, 2004
Semiconductor devices Mechanical and climatic test methods Part 23: High temperature operating life
A description is not available for this item.

References

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