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DLA - SMD-5962-94696

MICROCIRCUIT, DIGITAL, ECL, LOW SKEW QUAD CLOCK DRIVER, MONOLITHIC SILICON

inactive
Organization: DLA
Publication Date: 6 June 1994
Status: inactive
Page Count: 15
scope:

This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes Q, and M) and space application (device class V), and a choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). Device class M microcircuits represent non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883, "Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices". When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN.

The PIN shall be as shown in the following example:

Device classe M RHA marked devices shall meet the MIL-I-38535 specified RHA levels and shall be marked with the appropriate RHA designator. Device classes Q and V RHA marked devices shall meet the MIL-I-38535 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.

The device type(s) shall identify the circuit function as follows:

Device type Generic number Circuit function 01 100315 Low skew quad clock driver

The device class designator shall be a single letter identifying the product assurance level as follows:

Device class Device requirements documentation M Vendor self-certification to the requirements for non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883 Q or V Certification and qualification to MIL-I-38535

The case outline(s) shall be as designated in MIL-STD-1835 and as follows:

Outline letter Descriptive designator Terminals Package style F GDFP2-F16 or CDFP3-F16 16 flat package

The lead finish shall be as specified in MIL-STD-883 (see 3.1 herein) for class M or MIL-I-38535 for classes Q and V. Finish letter "X" shall not be marked on the microcircuit or its packaging. The "X" designation is for use in specifications when lead finishes A, B, and C are considered acceptable and interchangeable without preference.

Negative supply voltage range (VEE) - - - - - - - - - - - - - - - - - - - - −7.0 V dc to +0.5 V dc DC input voltage range (VIN) - - - - - - - - - - - - - - - - - - - - - - - VEE to +0.5 V Maximum dc output current (IOUT) - - - - - - - - - - - - - - - - - - - - - −50 mA Storage temperature range - - - - - - - - - - - - - - - - - - - - - - - - - −65°C to +150°C Lead temperature (soldering, 10 seconds) - - - - - - - - - - - - - - - - - +300°C Junction temperature (TJ) - - - - - - - - - - - - - - - - - - - - - - - - - +175°C Maximum power dissipation (PD) - - - - - - - - - - - - - - - - - - - - - - 500 mW Thermal resistance, junction-to-case (ΘJC) - - - - - - - - - - - - - - - - See MIL-STD-1835

Negative supply voltage range (VEE) - - - - - - - - - - - - - - - - - - - - −5.7 V dc minimum to −4.2 V dc maximum High level input voltage range (VIH) - - - - - - - - - - - - - - - - - - - −1165 mV dc minimum to −870 mV dc maximum Low level input voltage range (VIL) - - - - - - - - - - - - - - - - - - - - −1830 mV dc minimum to −1475 mV dc maximum Case operating temperature range (TC) - - - - - - - - - - - - - - - - - - - −55°C to +125°C

Fault coverage measurement of manufacturing logic tests (MIL-STD-883, test method 5012) - - - - - - - - - - - - - - - - - - - 2/ percent

intended Use:

Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.

Microcircuits... View More

Document History

July 16, 2019
MICROCIRCUIT, DIGITAL, ECL, LOW SKEW QUAD CLOCK DRIVER, MONOLITHIC SILICON
Scope. This drawing documents two product assurance class levels consisting of high reliability (device class Q and M) and space application (device class V). A choice of case outlines and lead...
October 16, 2014
MICROCIRCUIT, DIGITAL, ECL, LOW SKEW QUAD CLOCK DRIVER, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device class Q and M) and space application (device class V). A choice of case outlines and lead finishes are...
February 9, 2005
MICROCIRCUIT, DIGITAL, ECL, LOW SKEW QUAD CLOCK DRIVER, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
July 13, 1994
MICROCIRCUIT, DIGITAL, ECL, LOW SKEW QUAD CLOCK DRIVER, MONOLITHIC SILICON
A description is not available for this item.
SMD-5962-94696
June 6, 1994
MICROCIRCUIT, DIGITAL, ECL, LOW SKEW QUAD CLOCK DRIVER, MONOLITHIC SILICON
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes Q, and M) and...
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