AFNOR - NF EN 60749-32/A1
Semiconductor devices - Mechanical and climatic test methods - Part 32 : flammability of plastic-encapsulated devices (externally induced)
active, Most Current
| Organization: | AFNOR |
| Publication Date: | 1 May 2011 |
| Status: | active |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
NF EN 60749-32/A1
May 1, 2011
Semiconductor devices - Mechanical and climatic test methods - Part 32 : flammability of plastic-encapsulated devices (externally induced)
A description is not available for this item.
November 1, 2003
Semiconductor devices - Mechanical and climatic test methods - Part 32 : flammability of plastic-encapsulated devices (externally induced)
A description is not available for this item.