AFNOR - NF EN 62374-1
Semiconductor devices - Part 1 : time-dependent dielectric breakdown (TDDB) test for inter-metal layers
active, Most Current
| Organization: | AFNOR |
| Publication Date: | 1 June 2011 |
| Status: | active |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
NF EN 62374-1
June 1, 2011
Semiconductor devices - Part 1 : time-dependent dielectric breakdown (TDDB) test for inter-metal layers
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