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BSI - BS IEC 60747-8

Semiconductor devices - Discrete devices Part 8: Field-effect transistors

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Organization: BSI
Publication Date: 30 June 2011
Status: active
Page Count: 80
ICS Code (Transistors): 31.080.30

Document History

BS IEC 60747-8
June 30, 2011
Semiconductor devices - Discrete devices Part 8: Field-effect transistors
A description is not available for this item.
BS IEC 60747-8 + A1
June 30, 2011
Semiconductor devices - Discrete devices Part 8: Field-effect transistors
A description is not available for this item.
BS IEC 60747-8
June 15, 2001
Semiconductor devices - Part 8: Field-effect transistors
A description is not available for this item.

References

This document references:
IEC 60749-23 - Semiconductor devices – Mechanical and climatic test methods – Part 23: High temperature operating life
Published by IEC on March 1, 2011
This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the device operating condition in an accelerated way, and is primarily...
This document references:
IEC 60749-34 - Semiconductor devices – Mechanical and climatic test methods – Part 34: Power cycling
Published by IEC on October 1, 2010
Scope and object This part of IEC 60749 describes a test method used to determine the resistance of a semiconductor device to thermal and mechanical stresses due to cycling the power dissipation of...
This document references:
IEC 60747-1 - Semiconductor devices – Part 1: General
Published by IEC on August 1, 2010
This part of IEC 60747 gives the general requirements applicable to the discrete semiconductor devices and integrated circuits covered by the other parts of IEC 60747 and IEC 60748 (see Annex A).
This document references:
IEC 60747-7 - Semiconductor devices – Discrete devices – Part 7: Bipolar transistors
Published by IEC on September 1, 2019
This part of IEC 60747-7 gives the requirements applicable to the following sub-categories of bipolar transistors excluding microwave transistors. – Small signal transistors (excluding switching and...
This document references:
IEC 60747-2 - Semiconductor devices - Part 2: Discrete devices - Rectifier diodes
Published by IEC on April 1, 2016
This part of IEC 60747 provides standards for the following categories or sub-categories of rectifier diodes, including: • line rectifier diodes; • avalanche rectifier diodes; • fast-switching...
This document references:
BS IEC 60747-2 - Semiconductor devices Part 2: Discrete devices - Rectifier diodes
Published by BSI on February 28, 2018
A description is not available for this item.
This document references:
BS IEC 60747-7 - Semiconductor devices – Discrete devices Part 7: Bipolar transistors
Published by BSI on February 28, 2011
A description is not available for this item.
This document references:
BS IEC 60747-1 - Semiconductor devices - Part 1: General
Published by BSI on June 30, 2006
A description is not available for this item.
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