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BSI - BS ISO 14701

Surface chemical analysis - X-ray photoelectron spectroscopy - Measurement of silicon oxide thickness

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Organization: BSI
Publication Date: 31 August 2011
Status: inactive
Page Count: 24
ICS Code (Chemical analysis): 71.040.40

Document History

BS ISO 14701
November 30, 2018
Surface chemical analysis - X-ray photoelectron spectroscopy - Measurement of silicon oxide thickness
A description is not available for this item.
BS ISO 14701
August 31, 2011
Surface chemical analysis - X-ray photoelectron spectroscopy - Measurement of silicon oxide thickness
A description is not available for this item.

References

This document references:
ISO TR 18392 - Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for determining backgrounds
Published by ISO on December 1, 2005
A description is not available for this item.
This document references:
ISO/IEC GUIDE 98-3 - Uncertainty of measurement - Part 3: Guide to the expression of uncertainty in measurement (GUM:1995) Supplement 1: Propagation of distributions using a Monte Carlo method TECHNICAL CORRIGENDUM 1
Published by ISO on May 15, 2009
A description is not available for this item.

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