DIN EN 60749-27/A1
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) (IEC 47/2107/CDV:2011); German version EN 60749-27:2006/FprA1:2011
inactive, Most Current
| Organization: | DIN |
| Publication Date: | 1 October 2011 |
| Status: | inactive |
| Page Count: | 6 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
DIN EN 60749-27/A1
October 1, 2011
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) (IEC 47/2107/CDV:2011); German version EN 60749-27:2006/FprA1:2011
A description is not available for this item.
May 1, 2005
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) (IEC 47/1804/CDV:2005); German version prEN 60749-27:2005
A description is not available for this item.
September 1, 2002
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing; Machine model (MM) (IEC 47/1624/CDV:2002); German version prEN 60749-27:2002
A description is not available for this item.
Related Products
Searching for related products...