ISO TS 11888
Nanotechnologies - Characterization of multiwall carbon nanotubes - Mesoscopic shape factors
inactive
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| Organization: | ISO |
| Publication Date: | 15 November 2011 |
| Status: | inactive |
| Page Count: | 24 |
| ICS Code (Physics. Chemistry): | 07.030 |
scope:
This Technical Specification describes methods for the characterization of mesoscopic shape factors of multiwall carbon nanotubes (MWCNTs). Techniques employed include scanning electron microscopy (SEM), transmission electron microscopy (TEM), viscometry, and light scattering analysis.
This Technical Specification also includes additional terms needed to define the characterization of scattered bending persistence length (SBPL). Two approximation methods are given for the evaluation of SBPL (which generally varies from several tens of nanometers to several hundred micrometers).
Well-established concepts and mathematical expressions, analogous to polymer physics, are utilized for the definition of mesoscopic shape factors of MWCNTs.
Document History
July 1, 2017
Nanotechnologies - Characterization of multiwall carbon nanotubes - Mesoscopic shape factors
This document describes methods for the characterization of mesoscopic shape factors of multiwall carbon nanotubes (MWCNTs). Techniques employed include scanning electron microscopy (SEM),...
ISO TS 11888
November 15, 2011
Nanotechnologies - Characterization of multiwall carbon nanotubes - Mesoscopic shape factors
This Technical Specification describes methods for the characterization of mesoscopic shape factors of multiwall carbon nanotubes (MWCNTs). Techniques employed include scanning electron microscopy...