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IEC 60747-12

Semiconductor devices - Part 12: Sectional specification for optoelectronic devices

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Organization: IEC
Publication Date: 1 August 1991
Status: inactive
Page Count: 44
ICS Code (Optoelectronics. Laser equipment): 31.260

Document History

IEC 60747-12
August 1, 1991
Semiconductor devices - Part 12: Sectional specification for optoelectronic devices
A description is not available for this item.

References

This document is referenced by:
IEC 61360-1 - Standard data element types with associated classification scheme – Part 1: Definitions – Principles and methods
Published by IEC on July 1, 2017
This part of IEC 61360 specifies principles for the definition of the properties and associated attributes and explains the methods for representing verbally defined concepts with appropriate data...
This document is referenced by:
CEI EN 60749-34 - Semiconductor devices - Mechanical and climatic test methods Part 34: Power cycling
Published by CEI on February 1, 2012
Scope and object This part of IEC 60749 describes a test method used to determine the resistance of a semiconductor device to thermal and mechanical stresses due to cycling the power dissipation of...
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