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BSI - BS DD IEC/PAS 60747-17

Semiconductor devices - Discrete devices Part 17: Magnetic and capacitive coupler for basic and reinforced isolation

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Organization: BSI
Publication Date: 31 December 2011
Status: inactive
Page Count: 44
ICS Code (Other semiconductor devices): 31.080.99

Document History

BS EN IEC 60747-17
November 30, 2020
Semiconductor devices Part 17: Magnetic and capacitive coupler for basic and reinforced insulation
A description is not available for this item.
BS EN IEC 60747-17
November 30, 2020
Semiconductor devices Part 17: Magnetic and capacitive coupler for basic and reinforced insulation
A description is not available for this item.
BS DD IEC/PAS 60747-17
December 31, 2011
Semiconductor devices - Discrete devices Part 17: Magnetic and capacitive coupler for basic and reinforced isolation
A description is not available for this item.

References

This document references:
IEC 62539 - Guide for the statistical analysis of electrical insulation breakdown data
Published by IEC on July 1, 2007
Electrical insulation systems and materials may be tested using constant stress tests in which times to breakdown are measured for a number of test specimens, and progressive stress tests in which...
This document references:
IEC 60068-2-67 - Environmental testing – Part 2-67: Tests – Test Cy: Damp heat, steady state, accelerated test primarily intended for components
Published by IEC on July 1, 2019
This International Standard provides a standard test procedure for the purpose of evaluating, in an accelerated manner, the resistance of small electrotechnical products, primarily non hermetically...
This document references:
60068-2-17 - Environmental testing – Part 2-17: Tests – Test Q: Sealing
Published by IEC on June 1, 2023
This part of IEC 60068 deals with seal tests applicable to the external and internal detection in container sealing of gross leaks and fine leaks to determine the effectiveness of seals of specimens....
This document references:
IEC 60060-1 - High-voltage test techniques – Part 1: General definitions and test requirements
Published by IEC on September 1, 2010
This part of IEC 60060 is applicable to: – dielectric tests with direct voltage; – dielectric tests with alternating voltage; – dielectric tests with impulse voltage; – dielectric tests with...
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