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DSF/PREN ISO 12179

Geometrical product specifications (GPS) – Surface texture: Profile method – Calibration of contact (stylus) instruments (ISO/DIS 12179:2020)

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Organization: DS
Status: active
Page Count: 26
ICS Code (Measuring instruments): 17.040.30
scope:

This document applies to the calibration of the metrological characteristics of contact (stylus) instruments for the measurement of surface texture by the profile method as defined in ISO 3274. The calibration is to be carried out with the aid of measurement standards. Annex B applies to the calibration of metrological characteristics of simplified operator contact (stylus) instruments which do not conform with ISO 3274.

Document History

January 25, 2022
Geometrical product specifications (GPS) – Surface texture: Profile method – Calibration of contact (stylus) instruments (ISO 12179:2021)
This document applies to the calibration of the metrological characteristics of contact (stylus) instruments for the measurement of surface texture by the profile method as defined in ISO 3274. The...
January 26, 2007
Geometrical product specifications (GPS) – Surface texture: Profile method – Calibration of contact (stylus) instruments
This International Standard applies to to the calibration of the metrological characteristics of contact (stylus) instruments for the measurement of surface texture by the profile method as defined...
May 5, 2000
Geometrical product specifications (GPS) – Surface texture: Profile method – Calibration of contact (stylus) instruments
This International Standard applies to to the calibration of the metrological characteristics of contact (stylus) instruments for the measurement of surface texture by the profile method as defined...
DSF/PREN ISO 12179
Geometrical product specifications (GPS) – Surface texture: Profile method – Calibration of contact (stylus) instruments (ISO/DIS 12179:2020)
This document applies to the calibration of the metrological characteristics of contact (stylus) instruments for the measurement of surface texture by the profile method as defined in ISO 3274. The...
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