DSF/PREN IEC 63287-1
Semiconductor devices – Generic semiconductor qualification guidelines – Part 1: Guidelines for LSI reliability qualification
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| Organization: | DS |
| Status: | active |
| Page Count: | 44 |
scope:
This part of IEC 63287-1 gives guidelines for reliability qualification plans of large scale semiconductor integrated circuit products (LSI). This document is not intended for military- and space-related applications. NOTE 1 - The manufacturer can use flexible sample sizes to reduce cost and maintain reasonable reliability by this guideline adaptation based on EDR-4708, AEC Q100, JESD47 or other relevant document can also be applicable if it is specified. NOTE 2 - The Weibull distribution method used in this document is one of several methods to calculate the appropriate sample size and test conditions of a given reliability project.
Document History
October 5, 2021
Semiconductor devices – Generic semiconductor qualification guidelines – Part 1: Guidelines for IC reliability qualification
This part of IEC 63287-1 gives guidelines for reliability qualification plans of large scale semiconductor integrated circuit products (LSI). This document is not intended for military- and...
DSF/PREN IEC 63287-1
Semiconductor devices – Generic semiconductor qualification guidelines – Part 1: Guidelines for LSI reliability qualification
This part of IEC 63287-1 gives guidelines for reliability qualification plans of large scale semiconductor integrated circuit products (LSI). This document is not intended for military- and...