VDI/VDE 5575 BLATT 2
X-ray optical systems - Measurement methods; Measurement set-up and methods for the evaluation of X-ray optical systems
active, Most Current
| Organization: | VDI |
| Publication Date: | 1 December 2019 |
| Status: | active |
| Page Count: | 31 |
| ICS Code (Optical measuring instruments): | 17.180.30 |
Document History
VDI/VDE 5575 BLATT 2
December 1, 2019
X-ray optical systems - Measurement methods; Measurement set-up and methods for the evaluation of X-ray optical systems
A description is not available for this item.
June 1, 2015
X-ray optical systems - Measurement methods - Measurement set-up and methods for the evaluation of X-ray optical systems
A description is not available for this item.