AENOR - UNE-EN 60749-4
Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
inactive
| Organization: | AENOR |
| Publication Date: | 30 May 2003 |
| Status: | inactive |
| Page Count: | 22 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
July 1, 2017
Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST) (Endorsed by Asociación Española de Normalización in July of 2017.)
A description is not available for this item.
UNE-EN 60749-4
May 30, 2003
Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
A description is not available for this item.