AENOR - UNE-EN 60749-2
Semiconductor devices - Mechanical and climatic test methods -- Part 2: Low air pressure.
active, Most Current
| Organization: | AENOR |
| Publication Date: | 30 May 2003 |
| Status: | active |
| Page Count: | 19 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
UNE-EN 60749-2
May 30, 2003
Semiconductor devices - Mechanical and climatic test methods -- Part 2: Low air pressure.
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