AENOR - UNE-EN 60749-19/A1
Semiconductor devices - Mechanical and climatic test methods -- Part 19: Die shear strength
active, Most Current
| Organization: | AENOR |
| Publication Date: | 19 January 2011 |
| Status: | active |
| Page Count: | 12 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
UNE-EN 60749-19/A1
January 19, 2011
Semiconductor devices - Mechanical and climatic test methods -- Part 19: Die shear strength
A description is not available for this item.
November 21, 2003
Semiconductor devices - Mechanical and climatic test methods -- Part 19: Die shear strength
A description is not available for this item.