AENOR - UNE-EN 60749-33
Semiconductor devices - Mechanical and climatic test methods -- Part 33: Accelerated moisture resistance - Unbiased autoclave
active, Most Current
| Organization: | AENOR |
| Publication Date: | 16 March 2005 |
| Status: | active |
| Page Count: | 17 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
UNE-EN 60749-33
March 16, 2005
Semiconductor devices - Mechanical and climatic test methods -- Part 33: Accelerated moisture resistance - Unbiased autoclave
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