AENOR - UNE-EN 60749-23
Semiconductor devices - Mechanical and climatic test methods -- Part 23: High temperature operating life
active
| Organization: | AENOR |
| Publication Date: | 16 March 2005 |
| Status: | active |
| Page Count: | 25 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
December 21, 2011
Semiconductor devices - Mechanical and climatic test methods -- Part 23: High temperature operating life
A description is not available for this item.
UNE-EN 60749-23
March 16, 2005
Semiconductor devices - Mechanical and climatic test methods -- Part 23: High temperature operating life
A description is not available for this item.