AENOR - UNE-EN 60749-16
Semiconductor devices. Mechanical and climatic test methods. Part 16: Particle impact noise detection (PIND)
active, Most Current
| Organization: | AENOR |
| Publication Date: | 21 November 2003 |
| Status: | active |
| Page Count: | 20 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
UNE-EN 60749-16
November 21, 2003
Semiconductor devices. Mechanical and climatic test methods. Part 16: Particle impact noise detection (PIND)
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