AENOR - UNE-EN 60749-5
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
inactive, Most Current
| Organization: | AENOR |
| Publication Date: | 21 November 2003 |
| Status: | inactive |
| Page Count: | 12 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
UNE-EN 60749-5
November 21, 2003
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
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