AENOR - UNE-EN 60749-32
Semiconductor devices - Mechanical and climatic test methods -- Part 32: Flammability of plastic-encapsulated devices (externally induced)
active
| Organization: | AENOR |
| Publication Date: | 18 March 2004 |
| Status: | active |
| Page Count: | 18 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
January 19, 2011
Semiconductor devices - Mechanical and climatic test methods -- Part 32: Flammability of plastic-encapsulated devices (externally induced)
A description is not available for this item.
UNE-EN 60749-32
March 18, 2004
Semiconductor devices - Mechanical and climatic test methods -- Part 32: Flammability of plastic-encapsulated devices (externally induced)
A description is not available for this item.