NPFC - MIL-STD-202-219
TEST METHOD STANDARD METHOD 219, SHEAR STRESS
active, Most Current
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| Organization: | NPFC |
| Publication Date: | 24 June 2020 |
| Status: | active |
| Page Count: | 7 |
scope:
Purpose.
The purpose of this test is to determine the integrity of materials and procedures used to attach surface mounted chip components to package headers or other substrates. This determination is based on a measure of force applied to the chip components, the type of failure resulting from this application of force (if failure occurs) and the visual appearance of the residual die attach media and substrate/header metallization.
Document History
MIL-STD-202-219
June 24, 2020
TEST METHOD STANDARD METHOD 219, SHEAR STRESS
Purpose.
The purpose of this test is to determine the integrity of materials and procedures used to attach surface mounted chip components to package headers or other substrates. This determination...
September 11, 2017
TEST METHOD STANDARD METHOD 219, SHEAR STRESS
Purpose. The purpose of this test is to determine the integrity of materials and procedures used to attach surface mounted chip components to package headers or other substrates. This determination...