AENOR - UNE-EN 60749-34
Semiconductor devices - Mechanical and climatic test methods -- Part 34: Power cycling
inactive
| Organization: | AENOR |
| Publication Date: | 16 March 2005 |
| Status: | inactive |
| Page Count: | 19 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
July 20, 2011
Semiconductor devices - Mechanical and climatic test methods -- Part 34: Power cycling
A description is not available for this item.
UNE-EN 60749-34
March 16, 2005
Semiconductor devices - Mechanical and climatic test methods -- Part 34: Power cycling
A description is not available for this item.