AENOR - UNE-EN 60749-20
Semiconductor devices - Mechanical and climatic test methods -- Part 20: Resistance of plastic-encapsulated SMDs to the combined effect of moisture and soldering heat
inactive
| Organization: | AENOR |
| Publication Date: | 11 June 2004 |
| Status: | inactive |
| Page Count: | 57 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
July 1, 2012
Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat
A description is not available for this item.
UNE-EN 60749-20
June 11, 2004
Semiconductor devices - Mechanical and climatic test methods -- Part 20: Resistance of plastic-encapsulated SMDs to the combined effect of moisture and soldering heat
A description is not available for this item.