AENOR - UNE-EN IEC 60749-41
Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices (Endorsed by Asociación Española de Normalización in October of 2020.)
active, Most Current
| Organization: | AENOR |
| Publication Date: | 1 October 2020 |
| Status: | active |
| Page Count: | 29 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
UNE-EN IEC 60749-41
October 1, 2020
Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices (Endorsed by Asociación Española de Normalización in October of 2020.)
A description is not available for this item.