AENOR - UNE-EN IEC 60749-30
Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing (Endorsed by Asociación Española de Normalización in November of 2020.)
active, Most Current
| Organization: | AENOR |
| Publication Date: | 1 November 2020 |
| Status: | active |
| Page Count: | 21 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
UNE-EN IEC 60749-30
November 1, 2020
Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing (Endorsed by Asociación Española de Normalización in November of 2020.)
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