AFNOR - NF EN IEC 60749-20
Semiconductor devices - Mechanical and climatic test methods - Part 20 : resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat
active, Most Current
| Organization: | AFNOR |
| Publication Date: | 9 October 2020 |
| Status: | active |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
NF EN IEC 60749-20
October 9, 2020
Semiconductor devices - Mechanical and climatic test methods - Part 20 : resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat
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