AFNOR - NF EN IEC 60749-41
Semiconductor devices - Mechanical and climatic test methods - Part 41 : standard reliability testing methods of non-volatile memory devices
active, Most Current
| Organization: | AFNOR |
| Publication Date: | 4 September 2020 |
| Status: | active |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
NF EN IEC 60749-41
September 4, 2020
Semiconductor devices - Mechanical and climatic test methods - Part 41 : standard reliability testing methods of non-volatile memory devices
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