AENOR - UNE-EN 60749-19
Semiconductor devices - Mechanical and climatic test methods -- Part 19: Die shear strength
active
| Organization: | AENOR |
| Publication Date: | 21 November 2003 |
| Status: | active |
| Page Count: | 8 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
January 19, 2011
Semiconductor devices - Mechanical and climatic test methods -- Part 19: Die shear strength
A description is not available for this item.
UNE-EN 60749-19
November 21, 2003
Semiconductor devices - Mechanical and climatic test methods -- Part 19: Die shear strength
A description is not available for this item.