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BSI - BS EN IEC 63185

Measurement of the complex permittivity for low-loss dielectric substrates balancedtype circular disk resonator method

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Organization: BSI
Publication Date: 31 January 2021
Status: active
Page Count: 20
ICS Code (RF connectors): 33.120.30

Document History

23/30461071 DC
November 23, 2023
Draft BS EN IEC 63185 Measurement of the complex permittivity for low-loss dielectric substrates balanced-type circular disk resonator method
A description is not available for this item.
BS EN IEC 63185
January 31, 2021
Measurement of the complex permittivity for low-loss dielectric substrates balancedtype circular disk resonator method
A description is not available for this item.

References

This document references:
EN 61338-1-3 - Waveguide Type Dielectric Resonators - Part 1-3: General Information and Test Conditions - Measurement Method of Complex Relative Permittivity for Dielectric Resonator Materials at Microwave Frequency test conditions - Measurement Method of Complex Relative Permittivity for Dielectric Resonator Materials at Microwave Frequency
Published by CENELEC on March 1, 2000
A description is not available for this item.
This document references:
EN 62810 - Cylindrical cavity method to measure the complex permittivity of low-loss dielectric rods
Published by CENELEC on May 1, 2015
This International Standard relates to a measurement method for complex permittivity of a dielectric rod at microwave frequency. This method has been developed to evaluate the dielectric properties...
This document references:
IEC 61338-1-3 - Waveguide Type Dielecctric Resonators - Part 1-3: General Information and Test Conditions - Measurement Method of Complex Relative Permittivity for Dielectric Resonator Materials at Microwave Frequency
Published by IEC on November 1, 1999
A description is not available for this item.
This document references:
IEC 62810 - Cylindrical cavity method to measure the complex permittivity of low-loss dielectric rods
Published by IEC on February 1, 2015
This International Standard relates to a measurement method for complex permittivity of a dielectric rod at microwave frequency. This method has been developed to evaluate the dielectric properties...
This document references:
ISO/IEC GUIDE 99 - International vocabulary of metrology - Basic and general concepts and associated terms (VIM)
Published by ISO on January 1, 2007
In this Vocabulary, a set of definitions and associated terms is given, in English and French, for a system of basic and general concepts used in metrology, together with concept diagrams to...
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