DS/EN IEC 63185
Measurement of the complex permittivity for low-loss dielectric substrates balanced-type circular disk resonator method
active, Most Current
Buy Now
| Organization: | DS |
| Publication Date: | 25 January 2021 |
| Status: | active |
| Page Count: | 22 |
| ICS Code (RF connectors): | 33.120.30 |
scope:
IEC 63185:2020 relates to a measurement method for complex permittivity of a dielectric substrates at microwave and millimeter-wave frequencies. This method has been developed to evaluate the dielectric properties of low-loss materials used in microwave and millimeter-wave circuits and devices. It uses higher-order modes of a balanced-type circular disk resonator and provides broadband measurements of dielectric substrates by using one resonator, where the effect of excitation holes is taken into account accurately on the basis of the mode-matching analysis.
Document History
DS/EN IEC 63185
January 25, 2021
Measurement of the complex permittivity for low-loss dielectric substrates balanced-type circular disk resonator method
IEC 63185:2020 relates to a measurement method for complex permittivity of a dielectric substrates at microwave and millimeter-wave frequencies. This method has been developed to evaluate the...
Balanced-type circular disk resonator method to measure the complex permittivity of low-loss dielectric substrates
This International Standard relates to a measurement method for complex permittivity of a dielectric substrates at microwave and millimeter-wave frequencies. This method has been developed to...