DSF/PREN IEC 61169-1-5
Radio frequency connectors – Part 1-5: Electrical test methods – Rise time degradation
inactive
| Organization: | DS |
| Status: | inactive |
| Page Count: | 11 |
scope:
This part of IEC 61169 provides test methods for the rise time degradation of radio frequency (RF) connector. This document is applicable to triaxial and other radio frequency connectors.
Document History
March 21, 2022
Radio frequency connectors – Part 1-5: Electrical test methods – Rise time degradation
IEC 61169-1-5:2022 provides test methods for the rise time degradation of radio frequency (RF) connector. This document is applicable to triaxial and other radio frequency connectors.
DSF/PREN IEC 61169-1-5
Radio frequency connectors – Part 1-5: Electrical test methods – Rise time degradation
This part of IEC 61169 provides test methods for the rise time degradation of radio frequency (RF) connector. This document is applicable to triaxial and other radio frequency connectors.