NEMA - WD 50000
High Ambient Temperature Test Procedure for Wiring Devices
active, Most Current
| Organization: | NEMA |
| Publication Date: | 1 January 2020 |
| Status: | active |
| Page Count: | 13 |
scope:
The purpose of this Standard is to define a process to evaluate wiring devices at high ambient temperatures for use in high-temperature environments.
The high ambient temperature is specified by the submitter. The test ambient shall be 50°C minimum with higher test ambient values specified in 5°C increments (e.g., 60°C, 65°C, 90°C, etc.) The results of testing may indicate a need for appropriate constructions.
Document History
WD 50000
January 1, 2020
High Ambient Temperature Test Procedure for Wiring Devices
The purpose of this Standard is to define a process to evaluate wiring devices at high ambient temperatures for use in high-temperature environments.
The high ambient temperature is specified by the...