AENOR - UNE-EN 60749-4
Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
inactive, Most Current
| Organization: | AENOR |
| Publication Date: | 30 May 2003 |
| Status: | inactive |
| Page Count: | 12 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
UNE-EN 60749-4
May 30, 2003
Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
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