AENOR - UNE-EN 60749-29
Semiconductor devices - Mechanical and climatic test methods -- Part 29: Latch-up test
inactive, Most Current
| Organization: | AENOR |
| Publication Date: | 9 July 2004 |
| Status: | inactive |
| Page Count: | 22 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
UNE-EN 60749-29
July 9, 2004
Semiconductor devices - Mechanical and climatic test methods -- Part 29: Latch-up test
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