BSI - BS IEC 62047-40
Semiconductor devices - Micro electromechanical devices Part 40: Test methods of micro-electromechanical inertial shock switch threshold
active, Most Current
| Organization: | BSI |
| Publication Date: | 30 September 2021 |
| Status: | active |
| Page Count: | 14 |
| ICS Code (Other semiconductor devices): | 31.080.99 |
Document History
BS IEC 62047-40
September 30, 2021
Semiconductor devices - Micro electromechanical devices Part 40: Test methods of micro-electromechanical inertial shock switch threshold
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