DSF/PREN IEC 63287-2
Semiconductor devices – Guidelines for reliability qualification plans – Part 2: Concept of mission profile
inactive
| Organization: | DS |
| Status: | inactive |
| Page Count: | 16 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
scope:
This part of IEC 63287 gives guidelines for the development of reliability qualification plans using the concept of mission profile, based on the environmental conditioning and proposed usage of the product. This document is not intended for military- and space-related applications.
Document History
May 24, 2023
Semiconductor devices – Guidelines for reliability qualification plans – Part 2: Concept of mission profile
This part of IEC 63287 gives guidelines for the development of reliability qualification plans using the concept of mission profile, based on the environmental conditioning and proposed usage of the...
Semiconductor devices – Guidelines for reliability qualification plans – Part 2: Concept of mission profile
This part of IEC 63287 gives guidelines for the development of reliability qualification plans using the concept of mission profile, based on the environmental conditioning and proposed usage of the...
DSF/PREN IEC 63287-2
Semiconductor devices – Guidelines for reliability qualification plans – Part 2: Concept of mission profile
This part of IEC 63287 gives guidelines for the development of reliability qualification plans using the concept of mission profile, based on the environmental conditioning and proposed usage of the...