DLA - MIL-STD-883-5 CHANGE 1
TEST METHOD STANDARD TEST PROCEDURES FOR MICROCIRCUITS PART 5: TEST METHODS 5000-5999
active, Most Current
| Organization: | DLA |
| Publication Date: | 18 November 2021 |
| Status: | active |
| Page Count: | 159 |
scope:
Purpose.
Part 5 of this test method standard establishes uniform test methods for the electrical testing (digital) to determine resistance to deleterious effects of natural elements and conditions surrounding military operations. For the purpose of this standard, the term "devices" includes such items as monolithic, multichip, film and hybrid microcircuits, microcircuit arrays, and the elements from which the circuits and arrays are formed. This standard is intended to apply only to microelectronic devices.
intended Use:
The intended use of this test method standard is to establish appropriate conditions for testing semiconductor devices to give test results that simulate the actual service conditions existing in... View More
Document History
MIL-STD-883-5 CHANGE 1
November 18, 2021
TEST METHOD STANDARD TEST PROCEDURES FOR MICROCIRCUITS PART 5: TEST METHODS 5000-5999
Purpose.
Part 5 of this test method standard establishes uniform test methods for the electrical testing (digital) to determine resistance to deleterious effects of natural elements and conditions...
September 16, 2019
TEST METHOD STANDARD TEST PROCEDURES FOR MICROCIRCUITS PART 5: TEST METHODS 5000-5999
Purpose.
Part 5 of this test method standard establishes uniform test methods for the electrical testing (digital) to determine resistance to deleterious effects of natural elements and conditions...