DSF/PREN IEC 63364-1
Semiconductor devices – Semiconductor devices for IoT system – Part 1: Test method of sound variation detection
inactive
| Organization: | DS |
| Status: | inactive |
| Page Count: | 14 |
scope:
This part of IEC 63364-1 provides terms, test method, and report of sound variation detection system based on IoT. It provides the evaluation method for each part of the sound variation detection system based on IoT in the block diagram, the characterization parameters, symbols, test setups and the conditions. In addition, this document defines the configuration items and criteria of standard space and firing situation for the quality evaluation measurement of sound field variation detection system with IoT.
Document History
February 2, 2023
Semiconductor devices – Semiconductor devices for IoT system – Part 1: Test method of sound variation detection
This part of IEC 63364-1 provides terms, test method, and report of sound variation detection system based on IoT. It provides the evaluation method for each part of the sound variation detection...
DSF/PREN IEC 63364-1
Semiconductor devices – Semiconductor devices for IoT system – Part 1: Test method of sound variation detection
This part of IEC 63364-1 provides terms, test method, and report of sound variation detection system based on IoT. It provides the evaluation method for each part of the sound variation detection...