DSF/PREN IEC 62496-2-5
Optical circuit boards – Basic test and measurement procedures – Part 2-5: Flexibility test for flexible opto-electric circuits
inactive
| Organization: | DS |
| Status: | inactive |
| Page Count: | 20 |
scope:
This part of IEC 62496-2 defines a test method for folding flexibility inspection of flexible opto-electric circuits with a MIT folding endurance tester and presents a guideline for a step stress test method for finding the predetermined minimum mechanical folding radii below which the flexible opto-electric circuits can be damaged by intended folding distortion. Here, test samples are used instead of products for the flexibility test of their flexible opto-electric circuits, and the test samples have the same layer structure as the products.
Document History
January 27, 2023
Optical circuit boards – Basic test and measurement procedures – Part 2-5: Flexibility test for flexible opto-electric circuits
This part of IEC 62496-2 defines a test method for folding flexibility inspection of flexible opto-electric circuits with a MIT folding endurance tester and presents a guideline for a step stress...
Optical circuit boards – Basic test and measurement procedures – Part 2-5: Flexibility test for flexible opto-electric circuits
This part of IEC 62496-2 defines a test method for folding flexibility inspection of flexible opto-electric circuits with a MIT folding endurance tester and presents a guideline for a step stress...
DSF/PREN IEC 62496-2-5
Optical circuit boards – Basic test and measurement procedures – Part 2-5: Flexibility test for flexible opto-electric circuits
This part of IEC 62496-2 defines a test method for folding flexibility inspection of flexible opto-electric circuits with a MIT folding endurance tester and presents a guideline for a step stress...