DLA - MIL-STD-883-2 CHANGE 1
TEST METHOD STANDARD MECHANICAL TEST METHODS FOR MICROCIRCUITS PART 2: TEST METHODS 2000-2999
| Organization: | DLA |
| Publication Date: | 12 January 2022 |
| Status: | active |
| Page Count: | 395 |
scope:
Purpose.
Part 2 of this test method standard establishes uniform test methods for the mechanical testing to determine resistance to deleterious effects of natural elements and conditions surrounding military operations. For the purpose of this standard, the term "devices" includes such items as monolithic, multichip, film and hybrid microcircuits, microcircuit arrays, and the elements from which the circuits and arrays are formed. This standard is intended to apply only to microelectronic devices.
Numbering system.
The test methods are designated by numbers assigned in accordance with the following system:
Classification of tests.
The mechanical test methods included in this part of a multipart test method standard are numbered 2001 to 2038 inclusive.
Test method revisions.
Revisions are numbered consecutively using a period to separate the test method number and the revision number. For example, 2001.2 designates the second revision of test method 2001.
intended Use:
The intended use of this test method standard is to establish appropriate conditions for testing semiconductor devices to give test results that simulate the actual service conditions existing in... View More
Document History
