scope:

This publication presents guidelines for evaluating the switching reliability of GaN power switches. It is applicable to planar enhancement-mode, depletion-mode, GaN integrated power solutions and cascode GaN power switches. It covers the following aspects: a) An approach for broad coverage, using the switching locus to represent switching stress in a standardized manner. b) The development of a lifetime model, based upon the type of application switching locus. c) The validation of reliable operation under application-use conditions. The publication will result in common methods for representing, evaluating and modeling the switching stress on GaN power switches, and ensuring their reliable operation in an application.