scope:

This document includes a menu of tests to use for evaluation of the long-term reliability of materials used as backsheets and encapsulants in PV modules. It is intended to provide information to supplement the baseline testing defined in IEC 61215 and IEC 61730, which are qualification tests with pass-fail criteria. It may be used by PV stakeholders in conjunction with IEC TS 63209-1, to provide more extended stress testing of the component materials than can practically be accomplished with PV modules. The data set resulting from testing is to be used for reliability analysis and is not intended to be used as a pass-fail test procedure. This part addresses polymeric materials in the crystalline silicon module laminates, specifically backsheets and encapsulants in Glass/Glass or Glass/Backsheet modules. Although not specifically addressed, it is expected to also have applicability to thin film technologies.