IEC - 60747-5-14
Semiconductor devices – Part 5-14: Optoelectronic devices – Light emitting diodes – Test method of the surface temperature based on the thermoreflectance method
active, Most Current
| Organization: | IEC |
| Publication Date: | 1 March 2022 |
| Status: | active |
| Page Count: | 26 |
| ICS Code (Other semiconductor devices): | 31.080.99 |
scope:
This part of IEC 60747-5 specifies the measuring method of the surface temperature of single LED die or package, based on the thermoreflectance (TR) method. TR is the effect that the reflectance of light changes with the temperature of a substance. This part measures relative change in the reflectance of light from a metal film deposited nearby on the metallurgical pn junction as the relative change in the LED junction temperature. The surface temperature can be approximated as the junction temperature when the thermal resistance effect between the metal surface and the pn junction is negligibly small.
Document History
60747-5-14
March 1, 2022
Semiconductor devices – Part 5-14: Optoelectronic devices – Light emitting diodes – Test method of the surface temperature based on the thermoreflectance method
This part of IEC 60747-5 specifies the measuring method of the surface temperature of single LED die or package, based on the thermoreflectance (TR) method. TR is the effect that the reflectance of...